Compressed Sensing Based Atomic Force Microscopy
نویسندگان
چکیده
منابع مشابه
Force sensing and mapping by atomic force microscopy
Over the past 15 years, advances in the ¢eld of atomic force microscopy (AFM) have broadened its use from a high-resolution imaging instrument to a device capable of detecting and quantifying single molecular forces between surfaces in nearnative conditions. This article reviews developments in the force sensing ¢eld and focuses particularly on research that has seen the AFM utilised to produce...
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ژورنال
عنوان ژورنال: Biophysical Journal
سال: 2014
ISSN: 0006-3495
DOI: 10.1016/j.bpj.2013.11.4375